Showing results: 1 - 15 of 87 items found.
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Shanghai Himalayal Co.
1. Number of channels: 2/4 electric signal interfaces & 1 EXT interface 2. Sampling frequency: maximum 200MGa/s 3. Sampling precision: 12bit 4. Range: 0.1mV~20V 5. Range switch: 1mV, 2mV, 5mV, 10mV, 20mV, 50mV, 100mV, 200mV, 500mV, 1V, 2V, 5V 6. Frequency band range: 1Hz-60MHz 7. Range non-linear error: 5% 8. Range of capacitance for test object: 6pF~250µF 9. Power source mode: internal lithium cell / AC 220V 10. Display: 6.5 inches TFT LCD 11. Resolution: 640×480 12. PV: 4GB 13. Hard disk: 32G stiff disk used for storing the test data
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6050 -
PRODIGIT Electronics Co, Ltd.
Single Output USB PD USB PD basic version:the single-group test systemarchitecture is as shown in the table, 5302A AC Source, 3302F + 3310F series and9922-R Quick Charge Controller.
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Sifos Technologies, Inc.
Explore PoE PD Test solutions from Sifos Technology. What type of testing does your Power-Over-Ethernet Powered Device need?
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Sifos Technologies, Inc.
Sifos Technologies offers the ultimate simplicity in testing a PD’s conformance to IEEE 802.3 Standards with Pass/ Fail reporting in the PD Conformance Test Suite available for purchase with the PDA-600 Family of Instruments.
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FPA Series -
High Voltage Inc.
FPA Series test sets perform field or factory testing on larger electrical apparatus, including motors & generators, switchgear, bushings, bus duct, etc. This series offers the higher kVA ratings needed (0-6/12 kV AC @ 6 kVA), but is still packaged for portability.
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PXP-500A -
Teledyne LeCroy
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Teledyne LeCroy
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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iWave Systems Technologies
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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27014 -
Chroma ATE Inc.
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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TS-960e -
Marvin Test Solutions, Inc.
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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17020E -
Chroma ATE Inc.
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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3380P -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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17040E -
Chroma ATE Inc.
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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3380D -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.